Semiconductor Equipment from Electronic Test Measurement Reliability Qualification Lab Test and Facilities Equipment
Category: MISC
Total Lots:
127
Total Sales:
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Price Distribution
| Year | Make | Model | Lot Description | Hammer Price | |
|---|---|---|---|---|---|
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THERMODYNAMICS | 9266 |
THERMODYNAMICS MODEL 9266 TEMPERATURE & HUMIDITY CHAMBER 0C TO 200F / 25%RH TO 95%RH
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TABAI | PR-4G PLATINOUS RAINBOW |
TABAI PR-4G PLATINOUS RAINBOW 85C/85%RH TRMPERATURE & HUMIDITY SYS -20 TO 100C / 30%RH TO 98%RH - TABAI PR-4G PLATINOUS RAINBOW 85OC/85%RH TRMPERATURE & HUMIDITY CHAMBER -20O TO 100OC / 30%RH TO 98%RH
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TABAI | HROV82-315-PSLATCH |
TABAI HROV82-315-PSLATCH AC TEMP/HUMIDITY CHAMBER W/PS RACK AND DRIVER CAGE -70OC TO 100OC/30%RH TO 95%RH
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BLUE M | POM7-206C-3 |
BLUE M POM7-206C-3 BAKE OVEN 343DEGC/650F
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DESPATCH | LEB1-69-1 LBB/LEB |
DESPATCH LEB1-69-1 LBB/LEB FORCED CONVECTION BENCH-TOP OVEN
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DESPATCH | EC235 (16235H) |
DESPATCH EC235 (16235H) ECOSPHERE ENVIRONMENTAL CHAMBER
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DESPATCH | PCB1-80 W/LN2 BURNIN HTOL OVEN |
DESPATCH PCB1-80 W/LN2 BURNIN HTOL OVEN
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ENVIROTRONICS | ET28-1-2 |
ENVIROTRONICS ET28-1-2 ENVIRONMENTAL TEST CHAMBER
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PROBER SOLUTIONS | MICROMANIPULATOR 200MM 8"WAFER PROBER W/ NEW WAVE LCSII 532 SYSTEM |
PROBER SOLUTIONS MICROMANIPULATOR 200MM 8"WAFER PROBER W/ NEW WAVE LCSII 532 SYSTEM
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8060 |
MICROMANIPULATOR 8060 200MM SUB-MICRON 8" WAFER PROBER
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8060 |
MICROMANIPULATOR 8060 200MM SUB-MICRON 8" WAFER PROBER
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ELECTROGLAS | EG3001X |
ELECTROGLAS EG3001X AUTOMATIC 6" GOLD CHUCK WAFER PROBER
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MICROMANIPULATOR 200MM 8060 SUB-MICRON 8" WAFER PROBER |
MICROMANIPULATOR 200MM 8060 SUB-MICRON 8" WAFER PROBER
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SIGNATONE | CM100 |
SIGNATONE CM100 6" MANUAL WAFER PROBER NICKEL CHUCK
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SIGNATONE | CM312 |
SIGNATONE CM312 300MM MANUAL WAFER PROBER WITH ISOLATION TABLE
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THERMONICS | T-2600BV |
THERMONICS T-2600BV PRECISION TEMPERATURE FORCING SYSTEM CONDITION USED DIMENSIONS DIMENSION UNIT : IN LOT WIDTH : 40 LOT DEPTH : 40 LOT HEIGHT : 40 WEIGHT UNIT : LB LOT WEIGHT : 60
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DDM NOVASTAR | GOLD PLACE LE40 |
DDM NOVASTAR GOLD PLACE LE40 AUTOMATIC PICK & PLACE SYSTEM CONDITION USED DIMENSIONS DIMENSION UNIT : IN LOT WIDTH : 48 LOT DEPTH : 40 LOT HEIGHT : 60 WEIGHT UNIT : LB LOT WEIGHT : 650
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NEXTEST SYSTEMS | MAVERICK II ST LIGHTNING TESTER |
NEXTEST SYSTEMS MAVERICK II ST LIGHTNING TESTER PERSONAL TESTER
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DATA I/O | FLEXHD BENCHTOP AUTOMATIC IC DEVICE PROGRAMMING SYSTEM |
DATA I/O FLEXHD BENCHTOP AUTOMATIC IC DEVICE PROGRAMMING SYSTEM CONDITION USED DIMENSIONS DIMENSION UNIT : IN LOT WIDTH : 36 LOT DEPTH : 36 LOT HEIGHT : 24 WEIGHT UNIT : LB LOT WEIGHT : 250
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THERMO FISHER HAAKE | A40 |
THERMO FISHER HAAKE A40 REFRIGERATED RECIRCULATING CHILLER W/ SC150 IMMERSION
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MI EQUIPMENT | LI5 VISION INSPECTION |
MI EQUIPMENT LI5 VISION INSPECTION & SUBSTRATE TO TAPE REEL SYSTEM
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MARKEM | U-1477 |
MARKEM U-1477 SEMIAUTOMATIC TRAY MARKER MARKING MACHINE
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WENTWORTH | MP200 8 |
WENTWORTH MP200 8 PRIGRAMMABLE ANALYTICAL GOLD CHUCK PROBER AMBIENT HOT
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RUCKER AND KOLL | 5" MANUAL PROBER |
RUCKER AND KOLL 5" MANUAL PROBER
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ORYX INSTRUMENTS CORPORATION | ESD SYSTEM 700 |
ORYX INSTRUMENTS CORPORATION ESD SYSTEM 700 MANUAL TESTER
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THERMOTRON | SMX-64-5-5 |
THERMOTRON SMX-64-5-5 ENVIRONMENTAL CHAMBER
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ENVIROTRONICS | SST32 |
ENVIROTRONICS SST32 TEMPERATURE -68C TO +177C CHAMBER
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THERMODYNAMICS 9266
THERMODYNAMICS MODEL 9266 TEMPERATURE & HUMIDITY CHAMBER 0C TO 200F / 25%RH TO 95%RH...
TABAI PR-4G PLATINOUS RAINBOW
TABAI PR-4G PLATINOUS RAINBOW 85C/85%RH TRMPERATURE & HUMIDITY SYS -20 TO 100C / 30%RH TO 98%RH - TA...
TABAI HROV82-315-PSLATCH
TABAI HROV82-315-PSLATCH AC TEMP/HUMIDITY CHAMBER W/PS RACK AND DRIVER CAGE -70OC TO 100OC/30%RH TO ...
BLUE M POM7-206C-3
BLUE M POM7-206C-3 BAKE OVEN 343DEGC/650F...
DESPATCH LEB1-69-1 LBB/LEB
DESPATCH LEB1-69-1 LBB/LEB FORCED CONVECTION BENCH-TOP OVEN...
DESPATCH EC235 (16235H)
DESPATCH EC235 (16235H) ECOSPHERE ENVIRONMENTAL CHAMBER...
DESPATCH PCB1-80 W/LN2 BURNIN HTOL OVEN
DESPATCH PCB1-80 W/LN2 BURNIN HTOL OVEN...
ENVIROTRONICS ET28-1-2
ENVIROTRONICS ET28-1-2 ENVIRONMENTAL TEST CHAMBER...
PROBER SOLUTIONS MICROMANIPULATOR 200MM 8"WAFER PROBER W/ NEW WAVE LCSII 532 SYSTEM
PROBER SOLUTIONS MICROMANIPULATOR 200MM 8"WAFER PROBER W/ NEW WAVE LCSII 532 SYSTEM...
8060
MICROMANIPULATOR 8060 200MM SUB-MICRON 8" WAFER PROBER...
8060
MICROMANIPULATOR 8060 200MM SUB-MICRON 8" WAFER PROBER...
ELECTROGLAS EG3001X
ELECTROGLAS EG3001X AUTOMATIC 6" GOLD CHUCK WAFER PROBER...
MICROMANIPULATOR 200MM 8060 SUB-MICRON 8" WAFER PROBER
MICROMANIPULATOR 200MM 8060 SUB-MICRON 8" WAFER PROBER...
SIGNATONE CM100
SIGNATONE CM100 6" MANUAL WAFER PROBER NICKEL CHUCK...
SIGNATONE CM312
SIGNATONE CM312 300MM MANUAL WAFER PROBER WITH ISOLATION TABLE...
THERMONICS T-2600BV
THERMONICS T-2600BV PRECISION TEMPERATURE FORCING SYSTEM CONDITION USED DIMENSIONS DIMENSION UNIT : ...
DDM NOVASTAR GOLD PLACE LE40
DDM NOVASTAR GOLD PLACE LE40 AUTOMATIC PICK & PLACE SYSTEM CONDITION USED DIMENSIONS DIMENSION UNIT ...
NEXTEST SYSTEMS MAVERICK II ST LIGHTNING TESTER
NEXTEST SYSTEMS MAVERICK II ST LIGHTNING TESTER PERSONAL TESTER...
DATA I/O FLEXHD BENCHTOP AUTOMATIC IC DEVICE PROGRAMMING SYSTEM
DATA I/O FLEXHD BENCHTOP AUTOMATIC IC DEVICE PROGRAMMING SYSTEM CONDITION USED DIMENSIONS DIMENSION ...
THERMO FISHER HAAKE A40
THERMO FISHER HAAKE A40 REFRIGERATED RECIRCULATING CHILLER W/ SC150 IMMERSION...
MI EQUIPMENT LI5 VISION INSPECTION
MI EQUIPMENT LI5 VISION INSPECTION & SUBSTRATE TO TAPE REEL SYSTEM...
MARKEM U-1477
MARKEM U-1477 SEMIAUTOMATIC TRAY MARKER MARKING MACHINE...
WENTWORTH MP200 8
WENTWORTH MP200 8 PRIGRAMMABLE ANALYTICAL GOLD CHUCK PROBER AMBIENT HOT...
RUCKER AND KOLL 5" MANUAL PROBER
RUCKER AND KOLL 5" MANUAL PROBER...
ORYX INSTRUMENTS CORPORATION ESD SYSTEM 700
ORYX INSTRUMENTS CORPORATION ESD SYSTEM 700 MANUAL TESTER...
THERMOTRON SMX-64-5-5
THERMOTRON SMX-64-5-5 ENVIRONMENTAL CHAMBER...
ENVIROTRONICS SST32
ENVIROTRONICS SST32 TEMPERATURE -68C TO +177C CHAMBER...