Semiconductor Probe Test Handling Packaging Peripherals Electronic Test

VEECO CONTOURGT-X PROFILOMETER OPTICAL PROFILING SYSTEM IXL2.5 IX20 IX50

CASCADE MICROTECH ELITE 300 WAFER PROBE STATION

CASCADE MICROTECH 12000 WAFER PROBER 8" THERMOCHUCK OPTEM A-ZOOM2 +CNTRL. SYSTEM FEATURES AN OPTEM A-ZOOM2 10X VIDEO MICROSCOPE HEAD (OBJECTIVE NOT INCLUDED), AN ATTOGUARD MICROCHAMBER ENCLOSURE, A KINETIC SYSTEMS VIBRAPLANE VIBRATION ISOLATION TABLE, AN 8" THERMOCHUCK WITH TPO3000A-2300-1 CONTROLLER, AND A COMPUTER WITH MONITOR, KEYBOARD, MOUSE AND NUCLEUS PROBER CONTROL SOFTWARE.

AGILENT 4072A ADVANCED PARAMETRIC TESTER. SYSTEM COMPONENTS: AGILENT 81110A 165/330MHZ PULSE PATTERN GENERATOR S/N DE41B05462, AGILENT 4284A PRECISION LCR METER 20HZ TO 1MHZ. S/N JP40G20738

CASCADE MICROTECH 12000 8"/200MM THERMOCHUCK WAFER PROBER, OPTEM A-ZOOM. SYSTEM FEATURES AN OPTEM A-ZOOM VIDEO MICROSCOPE HEAD (MODEL 389270C2; OBJECTIVE NOT INCLUDED), AN ATTOGUARD MICROCHAMBER ENCLOSURE, A KINETIC SYSTEMS 1202-22-12S VIBRAPLANE VIBRATION ISOLATION TABLE, AND AN 8" THERMOCHUCK (CONTROLLER NOT INCLUDED).

2005 RIGAKU TXRF-V300 TOTAL REFLECTION X-RAY FLUORESCENCE SEMICONDUCTOR CONTAMINATION ANALYSIS SYSTEM. INCLUDES RIGAKU ULTRAX18 SEMI X-RAY GENERATOR (18 KW, 40 KV / 450 MA), TAZMO S4008 WAFER HANDLING ROBOT, SUMITOMO RP-1512 CRYOGENIC REFRIGERATOR, MKS / ENI RF ELECTRONICS AND POWER SYSTEMS, ORIGINAL CONTROL ELECTRONICS AND POWER CABINETS, CHILLER UNIT, SOFTWARE RECOVERY AND SYSTEM MEDIA, CALIBRATION AND CONFIGURATION DOCUMENTATION. SYSTEM INFORMATION: RIGAKU TXRF-V300 S/N: BR76003 SYSTEM DATE: JULY 2005 ROBOT MANUFACTURED: NOVEMBER 2006 THREE-PHASE 208V CONFIGURATION. USED FOR ULTRA-TRACE CONTAMINATION ANALYSIS ON SILICON WAFERS.

KEITHLEY 3706A-S SYSTEM SWITCH W/ 3732 QUAD 4X28 REED RELAY MATRIX CARDS

MM MICROMANIPULATOR WM62 MITUTOYO WF MICRO-POSITIONER OPTICAL INSPECTION

LEGACY CHILLER LCS-D500-40-I, 460V 3-PHASE INDUSTRIAL PROCESS CHILLER. ELECTRICAL: 460 V, 3-PHASE, 60 HZ. CONTROL CIRCUIT: 21 A. MAXIMUM OVERCURRENT PROTECTION (MOP): 15 A. MINIMUM CIRCUIT AMPACITY (MCA): 15 A. S/N 21J02775

HEWLETT PACKARD 4156A PRECISION SEMICONDUCTOR PARAMETER ANALYZER, AND HEWLETT PACKARD 41501A SMU AND PULSE GENERATOR EXPANDER

KEYSIGHT DSOX4024 4-CHANNEL DIGITAL STORAGE OSCILLOSCOPE 200MHZ 5GSA/S

TEL P-12XL FULLY AUTOMATIC WAFER PROBER. WAFER SIZE SUPPORT: 200 MM (8") TO 300 MM (12"). APPLICATIONS: WAFER-LEVEL PARAMETRIC, FUNCTIONAL, AND RELIABILITY TESTING. WAFER CHUCK: PRECISION VACUUM CHUCK WITH OPTIONAL TEMPERATURE CONTROL. CHUCK TEMPERATURE RANGE: APPROXIMATELY 60C TO +200C (CONFIGURATION DEPENDENT). MOTION SYSTEM: PRECISION X-Y-Z- SERVO-CONTROLLED POSITIONING. POSITIONING ACCURACY: 1 M (X/Y). Z-AXIS ACCURACY: APPROXIMATELY 0.5 M. ALIGNMENT: AUTOMATIC WAFER MAPPING WITH OPTICAL PATTERN RECOGNITION (CONFIGURATION DEPENDENT). PROBE INTERFACE: COMPATIBLE WITH PARAMETRIC AND FUNCTIONAL PROBE CARD TEST HEADS. CONTROL SYSTEM: FULLY AUTOMATIC OPERATION WITH INTEGRATED WAFER MAPPING AND PROBE ALIGNMENT. POWER REQUIREMENTS: 200-240 VAC, 50/60 HZ, APPROXIMATELY 1.5-2.5 KVA. UTILITIES: CLEAN DRY AIR (0.5-0.7 MPA) AND VACUUM. DIMENSIONS: APPROXIMATELY 1.2 M (W) X 1.1 M (D) X 1.4 M (H). WEIGHT: APPROXIMATELY 650-750 KG.

AGILENT TECHNOLOGIES B1110A PULSE-/ PATTERN GENERATOR

AGILENT TECHNOLOGIES E3102A TEST HEAD FOR NS-8040 - SEMICONDUCTOR TEST HEAD DOCKING / WAFER PROBER INTERFACE ASSEMBLY (TEL / ELECTROGLAS / ACCRETECH STYLE) HIGH-DENSITY ELECTRICAL INTERFACE ASSEMBLY DESIGNED TO CONNECT AUTOMATED WAFER PROBERS OR SEMICONDUCTOR HANDLERS WITH AUTOMATED TEST EQUIPMENT (ATE). UTILIZING A PRECISION POGO-PIN CONTACT RING, INTEGRATED VACUUM AND COOLING CONNECTIONS, AND HIGH-VOLTAGE SIGNAL ROUTING, THE ASSEMBLY PROVIDES RELIABLE ELECTRICAL COMMUNICATION BETWEEN SEMICONDUCTOR DEVICES UNDER TEST (DUTS) AND TEST SYSTEMS WHILE SUPPORTING ACCURATE PROBE CARD ALIGNMENT AND THERMAL MANAGEMENT. COMMONLY USED WITH WAFER PROBERS AND HANDLERS FROM TEL, ELECTROGLAS, ACCRETECH, AND SIMILAR MANUFACTURERS IN SEMICONDUCTOR MANUFACTURING, ENGINEERING, AND R&D ENVIRONMENTS. TYPICAL SPECIFICATIONS: COMPONENT TYPE: SEMICONDUCTOR TEST HEAD DOCKING / WAFER-INTERFACE ASSEMBLY APPLICATION: INTERFACE BETWEEN WAFER PROBER OR DEVICE HANDLER AND AUTOMATED TEST EQUIPMENT (ATE) ELECTRICAL INTERFACE: HIGH-DENSITY CIRCULAR POGO-PIN CONTACT RING WITH SPRING-LOADED CONTACTS SIGNAL CAPACITY: TYPICALLY 100-300 ELECTRICAL CONNECTIONS (CONFIGURATION DEPENDENT) VOLTAGE RATING: UP TO APPROXIMATELY 10 KV (CONFIGURATION DEPENDENT) COOLING SYSTEM: INTEGRATED VACUUM AND/OR CHILLED AIR CONNECTIONS FOR THERMAL CONTROL AND PARTICLE MANAGEMENT CONTROL CONNECTIONS: ELECTRICAL HARNESS WITH CONTROL, INTERLOCK, THERMOCOUPLE, AND VACUUM SENSOR INTERFACES MOUNTING: PRECISION ALIGNMENT FRAME FOR INTEGRATION INTO WAFER PROBERS AND HANDLER SYSTEMS COMPATIBILITY: COMMONLY USED WITH ADVANTEST, TERADYNE, KEYSIGHT/AGILENT, AND OTHER SEMICONDUCTOR ATE PLATFORMS APPLICATIONS: PARAMETRIC TESTING, FUNCTIONAL TESTING, WAFER PROBING, DEVICE CHARACTERIZATION, AND RELIABILITY TESTING DESIGNED FOR SEMICONDUCTOR TEST CELLS, THIS INTERFACE ASSEMBLY PROVIDES SECURE HIGH-DENSITY ELECTRICAL CONNECTIONS, PRECISE MECHANICAL ALIGNMENT, AND INTEGRATED THERMAL MANAGEMENT BETWEEN AUTOMATED TEST EQUIPMENT AND WAFER PROBING OR DEVICE HANDLING SYSTEMS. ITS RUGGED INDUSTRIAL CONSTRUCTION MAKES IT SUITABLE FOR PRODUCTION FABS, ENGINEERING LABS, AND SEMICONDUCTOR PROCESS DEVELOPMENT FACILITIES.

SMC THERMO-CON CIRCULATOR PUMP MODEL: INR-244-264

EBARA PDV500 DRY VACUUM PUMP

EBARA DRY VACUUM PUMP

NEWPORT 9008 MODULAR CONTROLLER W/ 8X 8350 TEC MODULES. INCLUDES 8X 8350 TEC MODULES.

LECROY SDA 6020 SERIAL DATA ANALYZER DIGITAL OSCILLISCOPE

EBARA EV-A10-3 DRY VACUUM PUMP

THORLABS MCLS1 MULTI CHANNEL FIBER COUPLED LASER SOURCE 638/685/785/830

KEITHLEY 2701 ETHERNET MULTIMETER/DATA ACQUISITION SYSTEM

NEWPORT 5600 LASER DIODE DRIVER 5600-65. POWER CABLES, TABLES, CARTS, DOLLIES, ETC. ARE NOT INCLUDED.

EBARA PDV500 DRY VACUUM PUMP

KEYENCE LT-8160 LASER FOCUS DISPLACEMENT METER W/ LT-8020 SENSOR HEAD. S/N:

EBARA EV-A10-3 DRY VACUUM PUMP

JULABO FL1201 RECIRCULATING CHILLER

SPEEDGOAT MOBILE REAL-TIME TARGET MACHINE

SIGLENT SDG2042X 40MHZ 1.2GSA/S FUNCTION / ARBITRARY WAVEFORM GENERATOR

EBARA PDV500 DRY VACUUM PUMP

EBARA PDV500 DRY VACUUM PUMP

AIR COOL PLUS EMO 02 ERS 186-4500-000 S/N: 2720 E

EBARA PDV500 DRY VACUUM PUMP

SIGLENT SDG2042X 40MHZ 1.2GSA/S FUNCTION / ARBITRARY WAVEFORM GENERATOR

HEWLETT PACKARD E5250A LOW LEAKAGE SWITCH MAINFRAME

OLYMPUS BH3-MJL, OLYMPUS BH2-UMA, OLYMPUS U-PMTVC MICROSCOPE SYSTEM WITH CHIU TECHNICAL CORPORATION HG-DM MODEL. S/N: 5G10394

THORLABS LDC240C LASER DIODE CONTROLLER

EXIDE SYSTEM 1000 INDUSTRIAL BATTERY CHARGER MODEL G1-12-550

ELECTROGLAS EG5/300 CASCADE MICROTECH PS300 PARAMETRIC 12" WAFER PROBER

GW INSTEK AFG-3081 80MHZ ARBITRARY FUNCTION GENERATOR

KEITHLEY 3390 50MHZ ARBITRARY WAVEFORM GENERATOR

EDWARDS GATE VALVE S/N 11-83632

EDWARDS GATE VALVE WITH HIGH VACUUM FLANGE S/N 13-86610

STANFORD RESEARCH SYSTEMS SRS SR510 LOCK-IN AMPLIFIER

KEYSIGHT N2894A PASSIVE PROBE (10:1, 700MHZ, 10MOHM//9.5PF)

INFICON TRANSPECTOR 2.0 GAS ANALYSIS SYSTEM WITH MARATHON ELECTRIC MOTOR PUMP

HP 6438C DC POWER SUPPLY (IN: 208VAC, 3PH; OUT: 0-440/600V, 0-25/15A)

TEKTRONIX PWS4721 PROGRAMMABLE DC POWER SUPPLY (0-72V, 1.2A). ONLY INCLUDES ITEMS SHOWN; POWER CABLES, TABLES, CARTS, DOLLIES, ETC. ARE NOT INCLUDED.

TEKTRONIX PWS4721 PROGRAMMABLE DC POWER SUPPLY (0-72V, 1.2A). ONLY INCLUDES ITEMS SHOWN; POWER CABLES, TABLES, CARTS, DOLLIES, ETC. ARE NOT INCLUDED.

197A AUTORANGING MICROVOLT DMM